ScreenshotOnFailureCollector

public class ScreenshotOnFailureCollector
extends BaseDeviceMetricCollector

java.lang.Object
   ↳ com.android.tradefed.device.metric.BaseDeviceMetricCollector
     ↳ com.android.tradefed.device.metric.ScreenshotOnFailureCollector


Collector that will capture and log a screenshot when a test case fails. If default collection is enabled, it will collect screenshot at the specified levels.

Summary

Public constructors

ScreenshotOnFailureCollector()

Public methods

boolean captureModuleLevel()
void onTestEnd(DeviceMetricData testData, Map<String, MetricMeasurement.Metric> currentTestCaseMetrics)

Callback when a test case is ended.

void onTestFail(DeviceMetricData testData, TestDescription test)

Callback when a test case fails.

void onTestModuleEnded()

Allows capturing the module ended event.

void onTestRunEnd(DeviceMetricData runData, Map<String, MetricMeasurement.Metric> currentRunMetrics)

Callback when a test run is ended.

void onTestRunFailed(DeviceMetricData testData, FailureDescription failure)

Callback for testRunFailed events

void onTestRunStart(DeviceMetricData runData)

Callback when a test run is started.

void onTestStart(DeviceMetricData testData)

Callback when a test case is started.

Public constructors

ScreenshotOnFailureCollector

public ScreenshotOnFailureCollector ()

Public methods

captureModuleLevel

public boolean captureModuleLevel ()

Returns
boolean

onTestEnd

public void onTestEnd (DeviceMetricData testData, 
                Map<String, MetricMeasurement.Metric> currentTestCaseMetrics)

Callback when a test case is ended. This should be the time for clean up.

Parameters
testData DeviceMetricData: the DeviceMetricData holding the data for the test case. Will be the same object as during onTestStart(DeviceMetricData).

currentTestCaseMetrics Map: the current map of metrics passed to testEnded(TestDescription,Map).

Throws
DeviceNotAvailableException

onTestFail

public void onTestFail (DeviceMetricData testData, 
                TestDescription test)

Callback when a test case fails.

Parameters
testData DeviceMetricData: the DeviceMetricData holding the data for the test case.

test TestDescription: the TestDescription of the test case in progress.

Throws
DeviceNotAvailableException

onTestModuleEnded

public void onTestModuleEnded ()

Allows capturing the module ended event.

Throws
DeviceNotAvailableException

onTestRunEnd

public void onTestRunEnd (DeviceMetricData runData, 
                Map<String, MetricMeasurement.Metric> currentRunMetrics)

Callback when a test run is ended. This should be the time for clean up.

Parameters
runData DeviceMetricData: the DeviceMetricData holding the data for the run. Will be the same object as during onTestRunStart(DeviceMetricData).

currentRunMetrics Map: the current map of metrics passed to testRunEnded(long,Map).

Throws
DeviceNotAvailableException

onTestRunFailed

public void onTestRunFailed (DeviceMetricData testData, 
                FailureDescription failure)

Callback for testRunFailed events

Throws
DeviceNotAvailableException

onTestRunStart

public void onTestRunStart (DeviceMetricData runData)

Callback when a test run is started.

Parameters
runData DeviceMetricData: the DeviceMetricData holding the data for the run.

onTestStart

public void onTestStart (DeviceMetricData testData)

Callback when a test case is started.

Parameters
testData DeviceMetricData: the DeviceMetricData holding the data for the test case.

Throws
DeviceNotAvailableException